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authorDon Brady <[email protected]>2017-08-14 18:17:15 -0400
committerBrian Behlendorf <[email protected]>2017-08-14 15:17:15 -0700
commitd977122da92e870a6a8990437ced845a04c39cfc (patch)
tree7b4b35bcba2f4a459a1004b80adea63ff970bf4f /man/man8/zinject.8
parent42a76fc8d757ab82fc1ce8e5e1f2079e07a5b9d4 (diff)
Add corruption failure option to zinject(8)
Added a 'corrupt' error option that will flip a bit in the data after a read operation. This is useful for generating checksum errors at the device layer (in a mirror config for example). It is also used to validate the diagnosis of checksum errors from the zfs diagnosis engine. Reviewed-by: Brian Behlendorf <[email protected]> Signed-off-by: Don Brady <[email protected]> Closes #6345
Diffstat (limited to 'man/man8/zinject.8')
-rw-r--r--man/man8/zinject.81
1 files changed, 1 insertions, 0 deletions
diff --git a/man/man8/zinject.8 b/man/man8/zinject.8
index 50fecfb64..6b6c3733b 100644
--- a/man/man8/zinject.8
+++ b/man/man8/zinject.8
@@ -108,6 +108,7 @@ A vdev specified by path or GUID.
.BI "\-e" " device_error"
Specify
.BR "checksum" " for an ECKSUM error,"
+.BR "corrupt" " to flip a bit in the data after a read,"
.BR "dtl" " for an ECHILD error,"
.BR "io" " for an EIO error where reopening the device will succeed, or"
.BR "nxio" " for an ENXIO error where reopening the device will fail."